Paolo Rech

Pós-doutorado

Idiomas

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Organização de eventos

Participação em eventos

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Orientou

Produções bibliográficas

• BODMANN, PABLO ; PAPADIMITRIOU, GEORGE ; RECH JUNIOR, RUBENS LUIZ ; GIZOPOULOS, DIMITRIS ; Rech, Paolo . Soft Error Effects on Arm Microprocessors: Early Estimations vs. Chip Measurements. IEEE TRANSACTIONS ON COMPUTERS , v. 1, p. 1-1, 2021.

• FREYTAG, GABRIEL ; SERPA, MATHEUS S. ; LIMA, JOÃO V.F. ; Rech, Paolo ; NAVAUX, PHILIPPE O.A. . Collaborative execution of fluid flow simulation using non-uniform decomposition on heterogeneous architectures. JOURNAL OF PARALLEL AND DISTRIBUTED COMPUTING , v. 152, p. 11-20, 2021.

• PAGLIARINI, SAMUEL ; BENITES, LUIS ; MARTINS, MAYLER ; Rech, Paolo ; KASTENSMIDT, FERNANDA . Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 68, p. 1045-1053, 2021.

• DOS SANTOS, FERNANDO FERNANDES ; BRANDALERO, MARCELO ; SULLIVAN, MICHAEL ; RECH JUNIOR, RUBENS LUIZ ; MARTINS BASSO, PEDRO ; HUBNER, PROF. MICHAEL ; CARRO, LUIGI ; Rech, Paolo . Reduced Precision DWC: an Efficient Hardening Strategy for Mixed-Precision Architectures. IEEE TRANSACTIONS ON COMPUTERS , v. 1, p. 1-1, 2021.

• LIBANO, F. ; Rech, P. ; NEUMAN, B. ; LEAVITT, J. ; WIRTHLIN, M. ; BRUNHAVER, J. . How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 68, p. 865-872, 2021.

• BLOWER, SEBASTIAN ; Rech, Paolo ; CAZZANIGA, CARLO ; KASTRIOTOU, MARIA ; FROST, CHRISTOPHER D. . Evaluating and Mitigating Neutrons Effects on COTS EdgeAI Accelerators. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 68, p. 1719-1726, 2021.

• OLIVEIRA, DANIEL ; BLANCHARD, SEAN ; DEBARDELEBEN, NATHAN ; FERNANDES DOS SANTOS, FERNANDO ; PISCOYA DÁVILA, GABRIEL ; NAVAUX, PHILIPPE ; FAVALLI, ANDREA ; SCHAPPERT, OPALE ; WENDER, STEPHEN ; CAZZANIGA, CARLO ; FROST, CHRISTOPHER ; Rech, Paolo . Thermal neutrons: a possible threat for supercomputer reliability. JOURNAL OF SUPERCOMPUTING , v. 1, p. 1, 2020.

• BASSO, PEDRO MARTINS ; DOS SANTOS, FERNANDO FERNANDES ; Rech, Paolo . Impact of Tensor Cores and Mixed-Precision on the Reliability of Matrix Multiplication in GPUs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 1, p. 1-1, 2020.

• OLIVEIRA, DANIEL ; DOS SANTOS, FERNANDO F. ; DAVILA, GABRIEL PISCOYA ; CAZZANIGA, CARLO ; FROST, CHRISTOPHER ; BAUMANN, ROBERT C. ; Rech, Paolo . High-Energy vs. Thermal Neutron Contribution to Processor and Memory Error Rates. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 67, p. 1-1, 2020.

• LIBANO, F. ; WILSON, B. ; WIRTHLIN, M. ; Rech, P. ; BRUNHAVER, J. . Understanding the Impact of Quantization, Accuracy, and Radiation on the Reliability of Convolutional Neural Networks on FPGAs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 1, p. 1-1, 2020.

• GONCALVES, MARCIO M. ; LAMB, IVAN PETER ; Rech, Paolo ; BRUM, RAPHAEL M. ; AZAMBUJA, JOSE RODRIGO . Improving Selective Fault Tolerance in GPU Register Files by Relaxing Application Accuracy. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 1, p. 1-1, 2020.

• IBRAHIM, YOUNIS ; WANG, HAIBIN ; LIU, JUNYANG ; WEI, JINGHE ; CHEN, LI ; Rech, Paolo ; ADAM, KHALID ; GUO, GANG . Soft errors in DNN accelerators: A comprehensive review. MICROELECTRONICS RELIABILITY , v. 115, p. 113969, 2020.

• GONCALVES, MARCIO ; FERNANDES, FERNANDO ; LAMB, IVAN ; Rech, Paolo ; AZAMBUJA, JOSE RODRIGO . Selective Fault Tolerance for Register Files of Graphics Processing Units. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 66, p. 1-1, 2019.

• KIBAR, OGUN O. ; MOHAN, PRASHANTH ; Rech, Paolo ; MAI, KEN . Evaluating the Impact of Repetition, Redundancy, Scrubbing, and Partitioning on 28-nm FPGA Reliability Through Neutron Testing. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 66, p. 248-254, 2019.

• LIBANO, F. ; WILSON, B. ; ANDERSON, J. ; WIRTHLIN, M. J. ; CAZZANIGA, C. ; Frost, C. ; Rech, P. . Selective Hardening for Neural Networks in FPGAs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 66, p. 216-222, 2019.

• TAMBARA, LUCAS ANTUNES ; KASTENSMIDT, FERNANDA LIMA ; Rech, Paolo ; LINS, FILIPE ; MEDINA, NILBERTO H. ; ADDED, NEMITALA ; AGUIAR, VITOR A. P. ; SILVEIRA, MARCILEI A. G. . Reliability-Performance Analysis of Hardware and Software Co-Designs in SRAM-based APSoCs. IEEE Transactions on Nuclear Science , v. PP, p. 1-1, 2018.

• FRATIN, V. ; OLIVEIRA, D. ; NAVAUX, P. ; CARRO, L. ; Rech, P. . Energy-Delay-FIT Product to compare processors and algorithm implementations. MICROELECTRONICS RELIABILITY , v. 84, p. 112-120, 2018.

• LUNARDI, CAIO ; PREVILON, FRITZ ; KAELI, DAVID ; Rech, Paolo . On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. PP, p. 1-1, 2018.

• FERNANDES DOS SANTOS, FERNANDO ; CARRO, LUIGI ; Rech, Paolo . Kernel and Layer Vulnerability Factor to Evaluate Object Detection Reliability in GPUs. IET Computers and Digital Techniques , v. 1, p. 1-10, 2018.

• SANTOS, FERNANDO FERNANDES DOS ; PIMENTA, PEDRO FOLETTO ; LUNARDI, CAIO ; DRAGHETTI, LUCAS ; CARRO, LUIGI ; KAELI, DAVID ; Rech, Paolo . Analyzing and Increasing the Reliability of Convolutional Neural Networks on GPUs. IEEE TRANSACTIONS ON RELIABILITY , v. 68, p. 1-15, 2018.

• LINS, F. ; TAMBARA, L. A. ; KASTENSMIDT, F. L. ; RECH, P. . Register File Criticality and Compiler Optimization Effects on Embedded Microprocessors Reliability. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 1, p. 1-9, 2017.

• LUNARDI, CAIO ; QUINN, HEATHER ; MONROE, LAURA ; OLIVEIRA, DANIEL ; NAVAUX, PHILIPPE ; Rech, Paolo . Experimental and Analytical Analysis of Sorting Algorithms Error Criticality for HPC and Large Servers Applications. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 64, p. 1-1, 2017.

• LIBANO, F. ; Rech, P. ; TAMBARA, L. ; TONFAT, J. ; KASTENSMIDT, F. . On the Reliability of Linear Regression and Pattern Recognition Feed-Forward Artificial Neural Networks in FPGAs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 65, p. 1-1, 2017.

• SANTINI, T. C. ; Rech, Paolo ; G. Nazar ; WAGNER, F. R. . Beyond Cross-Section. ACM Transactions on Embedded Computing Systems , v. 15, p. 1-16, 2016.

• FERNANDEZ, F. ; WEIGEL, L. ; JUNG, C. ; NAVAUX, P. O. A. ; CARRO, LUIGI ; Rech, P. . Evaluation of Histogram of Oriented Gradients Soft Errors Criticality for Automotive Applications. ACM Transactions on Architecture and Code Optimization , v. PP, p. 1, 2016.

• SANTINI, THIAGO ; CARRO, LUIGI ; RECH WAGNER, FLAVIO ; Rech, Paolo . Reliability Analysis of Operating Systems and Software Stack for Embedded Systems. IEEE Transactions on Nuclear Science , v. 63, p. 2225-2232, 2016.

• OLIVEIRA, D. ; PILLA, L. ; SANTINI, T. C. ; RECH, P. . Evaluation and Mitigation of Radiation-Induced Soft Errors in Graphics Processing Units. IEEE Transactions on Computers (Print) , p. 1-1, 2015.

• QUINN, HEATHER M. ; ROBINSON, W. ; Rech, Paolo ; AGUIRRE, M. ; BARNARD, A. ; DESOGUS, M. ; ENTRENA, L. ; GARCIA-VALDERAS, M. ; GUERTIN, S. ; KAELI, D. ; KASTENSMIDT, F. L. ; KIDDIE, B. ; SANCHEZ-CLEMENTE, A. ; Sonza Reorda, Matteo ; Sterpone, L. ; WIRTHLIN, M. . Using Benchmarks for Radiation Testing of Microprocessors and FPGAs. IEEE Transactions on Nuclear Science , v. 62, p. 2547-2554, 2015.

• PILLA, L. L. ; OLIVEIRA, D. ; LUNARDI, C. B. ; NAVAUX, P. O. A. ; CARRO, LUIGI ; Rech, Paolo . Memory Access Time and Input Size Effects on Parallel Processors Reliability. IEEE Transactions on Nuclear Science , v. 62, p. 2627-2634, 2015.

• Rech, Paolo ; FAIRBANKS, T. ; QUINN, H. ; CARRO, L. . Threads Distribution Effects on Graphics Processing Units Neutron Sensitivity. IEEE Transactions on Nuclear Science , v. 60, p. 4220-4225, 2014.

• PILLA, L. L. ; Rech, P. ; SILVESTRI, F. ; Frost, C. ; NAVAUX, P. O. A. ; REORDA, M. SONZA ; CARRO, L. . Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs. IEEE Transactions on Nuclear Science , v. PP, p. 1-7, 2014.

• SABENA, D. ; Sonza Reorda, Matteo ; Sterpone, L. ; Rech, P. ; CARRO, L. . Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results. Microelectronics and Reliability , v. PP, p. 1-8, 2014.

• Rech, Paolo ; Frost, C. ; CARRO, L. . GPUs Neutron Sensitivity Dependence on Data Type. Journal of Electronic Testing , v. 30, p. 307-316, 2014.

• OLIVEIRA, DANIEL A. G. ; Rech, Paolo ; QUINN, HEATHER M. ; FAIRBANKS, THOMAS D. ; MONROE, LAURA ; MICHALAK, SARAH E. ; ANDERSON-COOK, CHRISTINE ; NAVAUX, PHILIPPE O. A. ; CARRO, LUIGI . Modern GPUs Radiation Sensitivity Evaluation and Mitigation Through Duplication With Comparison. IEEE Transactions on Nuclear Science , v. 61, p. 1-8, 2014.

• SABENA, D. ; Sterpone, L. ; CARRO, L. ; Rech, P. . Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications. IEEE Transactions on Nuclear Science , v. 61, p. 3123-3129, 2014.

• TARRILLO, JIMMY ; KASTENSMIDT, FERNANDA LIMA ; Rech, Paolo ; FROST, CHRISTOPHER ; VALDERRAMA, CARLOS . Neutron Cross-Section of N-Modular Redundancy Technique in SRAM-Based FPGAs. IEEE Transactions on Nuclear Science , v. 61, p. 1558-1566, 2014.

• Rech, P. ; NAZAR, G. L. ; Frost, C. ; CARRO, L. . GPUs Reliability Dependence on Degree of Parallelism. IEEE Transactions on Nuclear Science , v. 61, p. 1-1, 2014.

• Rech, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . An Efficient and Experimentally Tuned Software-Based Hardening Strategy for Matrix Multiplication on GPUs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , v. 60, p. 2797-2804, 2013.

• G. Nazar ; Rech, P. ; Frost, C. ; CARRO, L. . Radiation and Fault Injection Testing of a Fine-Grained Error Detection Technique for FPGAs. IEEE Transactions on Nuclear Science , v. PP, p. 1, 2013.

• AZAMBUJA, J. R. ; G. Nazar ; Rech, Paolo ; CARRO, L. ; KASTENSMIDT, F. L. ; FAIRBANKS, T. ; QUINN, H. . Evaluating Neutron Induced SEE in SRAM-based FPGA Protected by Hardware- and Software-based Fault Tolerant Techniques. IEEE Transactions on Nuclear Science , v. 59, p. 893-899, 2013.

• Rech, P. ; Galliere, Jean-Marc ; Girard, Patrick ; Griffoni, A. ; Boch, J. ; Wrobel, Frédéric ; Saigne, Frédéric ; Dilillo, Luigi . Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs under Dynamic-Stress. IEEE Transactions on Nuclear Science , v. PP, p. 1-7, 2012.

• Griffoni, Alessio ; van Duivenbode, Jeroen ; Linten, Dimitri ; Simoen, Eddy ; Rech, Paolo ; Dilillo, Luigi ; Wrobel, Frédéric ; Verbist, Patrick ; Groeseneken, Guido . . IEEE Transactions on Nuclear Science , p. 1-6, 2012.

• Rech, Paolo ; Galliere, Jean-Marc ; Girard, Patrick ; Wrobel, Frédéric ; Saigne, Frédéric ; Dilillo, Luigi . . IEEE Transactions on Nuclear Science , v. 58, p. 855-861, 2011.

• Wrobel, Frédéric ; Vaille, Jean-Roch ; Pantel, Denis ; Dilillo, Luigi ; Rech, Paolo ; Galliere, Jean-Marc ; Touboul, Antoine ; Chadoutaud, Pierre ; Cocquerez, Philippe ; Lacourty, Michel ; Lam-Trong, Thien ; Autran, Jean-Luc ; Chatry, Christian ; Laplanche, Florent ; Azais, Bruno ; Saigne, Frédéric . . IEEE Transactions on Nuclear Science , v. 58, p. 945-951, 2011.

• Rech, Paolo ; Paccagnella, Alessandro ; Grosso, Michelangelo ; Sonza Reorda, Matteo ; Melchiori, Fabio ; Loparco, Domenico ; Appello, Davide . . IEEE Transactions on Nuclear Science , v. 57, p. 2098-2105, 2010.

• RECH, P. ; Violante, M. ; Sterpone, L. ; Manuzzato, A. ; Gerardin, S. ; Bagatin, M. ; Paccagnella, A. ; Andreani, C. ; Gorini, G. ; Pietropaolo, A. ; Cardarilli, G. ; Pontarelli, S. ; Frost, C. . . IEEE Transactions on Nuclear Science , v. 54, p. 1184-1189, 2007.

• KASTENSMIDT, F. L. ; RECH, P. . FPGAs and Parallel Architectures for Aerospace Applications. 1. ed. Springer International Publishing Switzerland, 2015. 214p .

• TAMBARA, L. A. ; ALMEIDA, F. ; RECH, P. ; KASTENSMIDT, F. L. ; BRUNI, G. ; Frost, C. . Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects. Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects. 1ed.: , 2015, v. 9040, p. 331-338.

• KASTENSMIDT, F. L. ; RECH, P. . Radiation Effects and Fault Tolerance Techniques for FPGAs and GPUs. Radiation Effects and Fault Tolerance Techniques for FPGAs and GPUs. 1ed.: Springer International Publishing Switzerland, 2015, v. 9040, p. 1-.

• Rech, P. . Soft-Error Effects on Graphics Processing Units. Soft-Error Effects on Graphics Processing Units. 1ed.: Springer International Publishing Switzerland, 2015, v. 9040, p. 1010-.

• CONDIA, J. E. R. ; FERNANDES DOS SANTOS, FERNANDO ; Sonza Reorda, Matteo ; Rech, Paolo . Combining Architectural Simulation and Software Fault Injection for a Fast and Accurate CNNs Reliability Evaluation on GPUs. In: IEEE VLSI Test Symposium (VTS), 2021. VLSI Test Symposium (VTS) Proceedings.

• FERNANDES DOS SANTOS, FERNANDO ; HARI, S. K. S. ; BASSO, PEDRO MARTINS ; CARRO, LUIGI ; RECH, P. . Demystifying gpu reliability: comparing and combining beam experiments, fault simulation, and profiling. In: IEEE International Parallel and Distributed Processing Symposium (IPDPS), 2021. IEEE International Parallel and Distributed Processing Symposium (IPDPS), 2021.

• FERNANDES DOS SANTOS, FERNANDO ; CONDIA, J. E. R. ; CARRO, L. ; Sonza Reorda, Matteo ; Rech, Paolo . Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection. In: IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2021. IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2021.

• CONDIA, J. E. R. ; Rech, Paolo ; FERNANDES DOS SANTOS, FERNANDO ; CARRO, LUIGI ; Sonza Reorda, Matteo . Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening. In: IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2021. International Symposium on On-Line Testing and Robust System Design (IOLTS), 2021.

• FERNANDES DOS SANTOS, FERNANDO ; BRANDALERO, M. ; BASSO, PEDRO MARTINS ; HUBNER, M. ; CARRO, LUIGI ; RECH, P. . Reduced-Precision DWC for Mixed-Precision GPUs. In: IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2021. IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020.

• RECH JUNIOR, R. L. ; RECH, P. . Impact of Layers Selective Approximation on CNNs Reliability and Performance. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

• OLIVEIRA, DANIEL ; BLANCHARD, SEAN ; DEBARDELEBEN, NATHAN ; SANTOS, FERNANDO ; DAVILA, GABRIEL PISCOYA ; NAVAUX, P. O. A. ; CAZZANIGA, C. ; Frost, C. ; Rech, Paolo . Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. In: IEEE European Test Symposium, 2020, Tallin. IEEE European Test Symposium 2020, 2020.

• CHATZIDIMITRIOU, ATHANASIOS ; BODMANN, PABLO ; PAPADIMITRIOU, GEORGE ; GIZOPOULOS, DIMITRIS ; Rech, Paolo . Demystifying Soft Error Assessment Strategies on ARM CPUs: Microarchitectural Fault Injection vs. Neutron Beam Experiments. In: IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2019, Portland. 2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2019. p. 26.

• DAVILA, GABRIEL PISCOYA ; OLIVEIRA, DANIEL ; NAVAUX, P. O. A. ; Rech, Paolo . Identifying the Most Reliable Collaborative Workload Distribution in Heterogeneous Devices. In: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019, Firenze. 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019.

• FERNANDES DOS SANTOS, FERNANDO ; NAVAUX, PHILIPPE ; CARRO, L. ; Rech, Paolo . Impact of Reduced Precision in the Reliability of Deep Neural Networks for Object Detection. In: IEEE European Test Symposium (ETS), 2019, Baiden-Baiden. 2019 IEEE European Test Symposium (ETS), 2019.

• DAVILA, GABRIEL PISCOYA ; OLIVEIRA, D. ; NAVAUX, P. O. A. ; Rech, Paolo . Impact of Workload Distribution on Energy Consumption, Performance, and Reliability of Heterogeneous Devices. In: Euromicro International Conference on Parallel, Distributed and NetworkBased Processing (PDP), 2019, Pavia. 2019 27th Euromicro International Conference on Parallel, Distributed and Network-Based Processing (PDP), 2019.

• FERNANDES DOS SANTOS, FERNANDO ; LUNARDI, C. B. ; OLIVEIRA, DANIEL ; LIBANO, FABIANO ; Rech, Paolo . Reliability Evaluation of Mixed-Precision Architectures. In: IEEE International Symposium on High Performance Computer Architecture (HPCA), 2019, Washington. 2019 IEEE International Symposium on High Performance Computer Architecture (HPCA), 2019.

• PREVILON, FRITZ ; KALRA, CHARU ; KAELI, DAVID ; Rech, P. . A comprehensive evaluation of the effects of input data on the resilience of GPU applications. In: DFT - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2019, Noordwijk. 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019. p. 1-6.

• DRAGHETTI, LUCAS ; FERNANDES DOS SANTOS, FERNANDO ; CARRO, L. ; Rech, Paolo . Detecting Errors in Convolutional Neural Networks Using Inter Frame Spatio-Temporal Correlation. In: IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Rodhes. 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019.

• OLIVEIRA, D. ; NAVAUX, P. O. A. ; Rech, Paolo . Increasing the efficiency and efficacy of selective-hardening for parallel applications. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019, Delft. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019.

• FREYTAG, G. ; SERPA, M. ; LIMA, J. V. F. ; Rech, Paolo ; NAVAUX, P. O. A. . Non-uniform Partitioning for Collaborative Execution on Heterogeneous Architectures. In: International Symposium on Computer Architecture and High Performance Computing, 2019. Non-uniform Partitioning for Collaborative Execution on Heterogeneous Architectures, 2019.

• SEKANINA, L. ; VASICEK, Z. ; Bosio, A. ; TRAIOLA, M. ; Rech, P. ; OLIVERIA, D. ; FERNANDES, F. ; DI CARLO, S. . Special session: How approximate computing impacts verification, test and reliability. In: 2018 IEEE 36th VLSI Test Symposium (VTS), 2018, San Francisco. 2018 IEEE 36th VLSI Test Symposium (VTS), 2018. p. 1.

• OLIVEIRA, D. ; MOREIRA, F. B. ; Rech, Paolo ; NAVAUX, P. O. A. . Predicting the Reliability Behavior of HPC Applications. In: SBAC-PAD - International Symposium on Computer Architecture and High Performance Computing, 2018, lyon. International Symposium on Computer. Architecture and High Performance Computing (SBAC-PAD) proceedings, 2018.

• NETO, V. ; OLIVEIRA, D. ; LUNARDI, C. B. ; DOS SANTOS, FERNANDO FERNANDES ; RODRIGUES, GENNARO ; Rech, Paolo . Code-Dependent and Architecture-Dependent Reliability Behaviors. In: IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2018, Luxembourgh City. 2018 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2018.

• PREVILON, FRITZ ; KALRA, CHARU ; KAELI, DAVID ; Rech, Paolo . Evaluating the impact of execution parameters on program vulnerability in GPU applications. In: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018, Dresden. 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018.

• SANTINI, T. C. ; BORCHERT, C. ; DIETRICH, C. ; SCHIRMEIER, H. ; HOFFMANN, M. ; SPINCZYK, O. ; LOHMANN, D. ; WAGNER, F. R. ; RECH, P. . Effectiveness of Software-Based Hardening for Radiation-Induced Soft Errors in Real-Time Operating Systems. In: arcs, 2017, Vienna. ARCS proceedings, 2017.

• OLIVEIRA, D. ; PILLA, L. ; HANZICH, M. ; NETO, V. ; FERNANDEZ, F. ; LUNARDI, C. B. ; CELA, J. M. ; NAVAUX, P. O. A. ; CARRO, LUIGI ; Rech, Paolo . RADIATION-INDUCED ERROR CRITICALITY IN MODERN HPC PARALLEL ACCELERATORS. In: High Performance Computer Architecture 2017, 2017, Austin. HPCA 2017 Proceedings, 2017.

• FERNANDEZ, F. ; KLEIN, L. ; WEIGEL, L. ; CARRO, L. ; NAVAUX, P. O. A. ; RECH, P. . Evaluation and Mitigation of Soft-Errors in Neural Network-based Object Detection in Three GPU Architectures. In: The 47th IEEE/IFIP International Conference on Dependable Systems and Networks, 2017, Denver. DSN 2017 proceedings, 2017.

• OLIVEIRA, D. ; DEBARDELEBEN, N. ; BLANCHARD, S. ; QUINN, H. ; KOREN, I. ; NAVAUX, P. O. A. ; RECH, P. . Experimental and Analytical Study of Xeon Phis Reliability. In: SC - International Conference for High Performance Computing, Networking, Storage and Analysis, 2017, Denver. SC - International Conference for High Performance Computing, Networking, Storage and Analysis, 2017.

• WEIGEL, LUCAS ; FERNANDES, FERNANDO ; NAVAUX, PHILIPPE ; Rech, Paolo . Kernel vulnerability factor and efficient hardening for histogram of oriented gradients. In: 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017, Cambridge. 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017. p. 1.

• FERNANDEZ, F. ; WEIGEL, L. ; JUNG, C. ; NAVAUX, P. O. A. ; CARRO, LUIGI ; RECH, P. . Radiation Sensitivity Evaluation of Pedestrian Detection Algorithm. In: Radiation and Its Effects on Components and Systems, 2016, Bremen. radecs 2016 proceedings, 2016.

• LUNARDI, C. B. ; QUINN, H. ; MONROE, LAURA ; OLIVEIRA, D. ; NAVAUX, P. ; RECH, P. . On the Error Criticality of Sorting Algorithms for HPC and Large Servers Applications. In: radiation and Its Effects on Components and Systems, 2016, bremen. radecs 2016 proceedings, 2016.

• LINS, F. ; TAMBARA, L. A. ; TONFAT, J. ; KASTENSMIDT, F. L. ; RECH, P. . Register File Criticality on Embedded Microprocessor Reliability. In: radiation and Its Effects on Components and Systems, 2016, bremen. radecs 2016 proceedings, 2016.

• OLIVEIRA, D. ; PILLA, L. ; FERNANDEZ, F. ; LUNARDI, C. B. ; NAVAUX, P. O. A. ; RECH, P. . Reliability Analysis of Modern HPC Parallel Accelerators. In: Silicon Errors in Logic System Effects, 2016, Austin. SELSE 2016, 2016.

• SANTINI, T. C. ; BORCHERT, C. ; DIETRICH, C. ; HOFFMAN, M. ; SPNICZYK, O. ; LOHMANN, D. ; WAGNER, F. R. ; RECH, P. . Evaluating the Radiation Reliability of Dependability-Oriented Real-Time Operating Systems. In: silicon Errors in Logic System Effects, 2016, austin. seLSE 2016, 2016.

• TIWARI, DEVESH ; GUPTA, SAURABH ; ROGERS, JAMES ; MAXWELL, DON ; Rech, Paolo ; VAZHKUDAI, SUDHARSHAN ; OLIVEIRA, DANIEL ; LONDO, DAVE ; DEBARDELEBEN, NATHAN ; NAVAUX, PHILIPPE ; CARRO, LUIGI ; BLAND, ARTHUR . Understanding GPU errors on large-scale HPC systems and the implications for system design and operation. In: 2015 IEEE 21st International Symposium on High Performance Computer Architecture (HPCA), 2015, Burlingame. 2015 IEEE 21st International Symposium on High Performance Computer Architecture (HPCA), 2015. p. 331.

• OLIVEIRA, D. ; PILLA, L. ; LUNARDI, C. B. ; CARRO, L. ; NAVAUX, P. O. A. ; RECH, P. . The Path to Exascale: Code Optimizations and Hardening Solutions Reliability. In: Fault Tolerance for HPC at eXtreme Scale (FTXS), 2015, Portland. Fault Tolerance for HPC at eXtreme Scale (FTXS) Workshop Proceedings, 2015.

• DEBARDELEBEN, N. ; BLANCHARD, S. ; KAELI, D. ; RECH, P. . Field and Experimental Data on Soft Error in Large-Scale HPC Systems and Analysis of the Implication for Exascale System Design. In: IEEE VLSI Test Symposium (VTS), 2015, Napa. IEEE VLSI Test Symposium Proceedings, 2015.

• SANTINI, T. C. ; RECH, P. ; CARRO, L. ; WAGNER, F. R. . Exploiting Cache Conflicts to Reduce Radiation Sensitivity of Operating Systems on Embedded Systems. In: International Conference on Compilers, Architecture, and Synthesis for Embedded Systems (CASES), 2015, Amsterdam. International Conference on Compilers, Architecture, and Synthesis for Embedded Systems 2015 Proceeding, 2015.

• SANTINI, T. C. ; CARRO, L. ; WAGNER, F. R. ; Rech, Paolo . Reliability Analysis of Operating Systems for Embedded SoC. In: Conference on RADIATION EFFECTS on COMPONENTS and SYSTEMS (RADECS), 2015, Moscow. RADECS 2015 Proceedings, 2015.

• SANTINI, T. C. ; CARRO, L. ; WAGNER, F. R. ; Rech, Paolo . Reliability Analysis of Operating Systems for Embedded SoC. In: radecs, 2015, Moscow. radecs 2015 proceedings, 2015.

• TAMBARA, L. A. ; Rech, Paolo ; KASTENSMIDT, F. L. . Analyzing the Failure Impact of Using Hard- and Soft-cores in All Programmable SoC under Neutron-induced Upsets. In: Radecs 2015, 2015, Moscow. radecs 2015 proceedings, 2015.

• OLIVEIRA, D. ; Rech, P. ; PILLA, L. ; NAVAUX, P. O. A. ; CARRO, L. . GPGPUs ECC Efficiency and Efficacy. In: DFT, 2014, Amsterdam. DFT Proceedings, 2014.

• Rech, Paolo ; PILLA, L. L. ; NAVAUX, P. ; CARRO, L. . Impact of GPUs Parallelism Management on Safety-Critical and HPC Applications Reliability. In: IEEE Dependable Systems and Network (DSN), 2014, Atlanta. IEEE Dependable Systems and Network proceedings, 2014.

• OLIVEIRA, D. ; LUNARDI, C. B. ; PILLA, L. ; Rech, Paolo ; NAVAUX, P. ; CARRO, L. . Radiation Sensitivity of High Performance Computing Applications on Kepler-Based GPGPUs. In: Fault Tolerance for HPC at eXtreme Scale (FTXS) Workshop, 2014, Atlanta. Fault Tolerance for HPC at eXtreme Scale (FTXS) Workshop Proceedings, 2014.

• BRUNI, G. ; Rech, Paolo ; TAMBARA, L. A. ; G. Nazar ; KASTENSMIDT, F. L. ; REIS, R. ; Paccagnella, A. . Power Dissipation Effects on 28nm FPGA-Based System on Chips Neutron Sensitivity. In: VLSI-SoC, 2014, Cancun. VLSI-SoC proceedings, 2014.

• SANTINI, T. C. ; Rech, Paolo ; G. Nazar ; CARRO, L. ; WAGNER, F. R. . Reducing Embedded Software Radiation-Induced Failures Through Cache Memories. In: IEEE European Test Symposium, 2014, Paderborn. IEEE European Test Symposium Proceedings, 2014.

• TAMBARA, L. A. ; KASTENSMIDT, F. L. ; Rech, Paolo ; Frost, C. . Decreasing FIT with Diverse Triple Modular Redundancy in SRAM-based FPGAs. In: DFT, 2014, A. DFT Proceedings, 2014.

• TONFAT, J. ; AZAMBUJA, J. R. ; G. Nazar ; Rech, Paolo ; CARRO, L. ; REIS, R. ; KASTENSMIDT, F. L. ; VARGAS, F. ; BEZERRA, E. ; Frost, C. . Analyzing the Influence of Voltage Scaling for Soft Errors in SRAM-based FPGAs. In: IEEE Mixed-Signal Test Workshop (IMSTW), 2014, Porto Alegre. IEEE Mixed-Signal Test Workshop (IMSTW) Proceedings, 2014.

• GOMEZ, L. B. ; CAPELLO, F. ; CARRO, L. ; DEBARDELEBEN, N. ; FANG, B. ; GURUMURTHI, S. ; PATTABIRAMAN, K. ; Rech, Paolo ; Sonza Reorda, Matteo . GPGPUs: How to Combine High Computational Power with High Reliability. In: Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014, Dresden. Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014.

• TAMBARA, L. A. ; ALMEIDA, F. ; Rech, Paolo ; KASTENSMIDT, F. L. ; BRUNI, G. ; Frost, C. ; QUINN, H. . Evaluating the Robustness of TMR Schemes with Different Levels of Granularity in SRAM-based FPGAs under Neutron-induced Effects. In: Nuclear and Space Radiation Effects Symposium, 2014, Paris. Nuclear and Space Radiation Effects Symposium, 2014.

• OLIVEIRA, D. ; Rech, Paolo ; NAVAUX, P. O. A. ; CARRO, L. . DUPLICATION WITH COMPARISON FOR HIGH PERFORMANCE COMPUTING APPLICATIONS ON GRAPHICS PROCESSING UNITS. In: Nuclear and Space Radiation Effects Symposium, 2014, Paris. Nuclear and Space Radiation Effects Symposium, 2014.

• GUO, Y. ; SABENA, D. ; Sterpone, L. ; CARRO, L. ; Rech, Paolo . RELIABILITY EVALUATION OF EMBEDDED GPUS FOR SAFETY CRITICAL APPLICATIONS. In: Nuclear and Space Radiation Effects Symposium, 2014, Paris. Nuclear and Space Radiation Effects Symposium, 2014.

• Rech, Paolo ; CARRO, L. ; WANG, N. ; TSAI, T. ; HARI, S. K. S. ; KECKLER, S. . Measuring the Radiation Reliability of SRAM Structures in GPUs Designed for HPC. In: SELSE, 2014, Stanford. SELSE Proceedings, 2014.

• Rech, P. ; CARRO, L. . Reducing the Code Degree Of Parallelism to Increase GPUs Reliability. In: SELSE, 2014, Stanford. SELSE Proceedings, 2014.

• KASTENSMIDT, F. L. ; TONFAT, J. ; BOTH, T. ; WIRTH, G. ; Rech, Paolo ; REIS, R. ; BENOIT, P. ; BRUGUIER, F. ; TORRES, L. . Analysing Aging and Voltage Scaling Impacts under Neutron-induced Soft Error Rate in SRAM-based Field Programmable Gate Arrays. In: ESREF, 2014, Berlin. ESREF 2014 Proceedings, 2014.

• Rech, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . Neutron Sensitivity of Integer and Floating Point Operations executed in GPUs. In: LATW, 2013, Cordoba. IEEE LATW proceeding, 2013.

• Rech, P. ; CARRO, L. . Experimental Evaluation of Neutron-Induced Effects in Graphic Processing Units. In: SELSE, 2013, Stanford. SELSE Proceedings, 2013.

• RECH, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . Neutron Sensitivity of Integer and Floating Point Operations Executed in GPUs. In: Latin American Test Workshop, 2013, Cordoba. Latin American Test Workshop Proceedings, 2013.

• Rech, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . Experimental Evaluation of Thread Distribution Effects on Multiple Output Errors in GPUs. In: European Test Symposium, 2013, Avignon. European Test Symposium Proceedings, 2013.

• RECH, P. ; FAIRBANKS, T. ; CARRO, L. . Threads Distribution Effects on GPU Neutron Sensitivity. In: NSREC, 2013, San Francisco. Transaction on Nuclear Science, 2013.

• AZAMBUJA, J. R. ; G. Nazar ; Rech, P. ; FAIRBANKS, T. ; KASTENSMIDT, F. L. . Combining Hardware- and Software-Based Techniques to Detect and Diagnose Neutron Induced Single Event Effects in SRAM-Based FPGA. In: NSREC, 2013, San Francisco. Transaction on Nuclear Science, 2013.

• Rech, P. ; PILLA, L. ; SILVESTRI, F. ; NAVAUX, P. ; CARRO, L. . Neutron Sensitivity and Software Hardening Strategies for Matrix Multiplication and FFT on Graphics Processing Units. In: The 3rd Workshop on Fault-Tolerance for HPC at Extreme Scale (FTXS 2013), 2013, New York. ACM FTXS 2013 Proceedings, 2013.

• RECH, P. ; PILLA, L. ; SILVESTRI, F. ; Frost, C. ; NAVAUX, P. ; CARRO, L. . Neutron Sensitivity and Hardening Strategies for Fast Fourier Transform on GPUs. In: RADECS 2013, 2013, Oxford. RADECS proceedings, 2013.

• TAMBARA, L. A. ; KASTENSMIDT, F. L. ; AZAMBUJA, J. R. ; CHIELLE, E. ; ALMEIDA, F. ; G. Nazar ; CARRO, L. ; RECH, P. ; Frost, C. . Evaluating the Effectiveness of a Diversity TMR Scheme under Neutrons. In: RADECS 2013, 2013, Oxford. RADECS proceedings, 2013.

• TARRILLO, J. ; KASTENSMIDT, F. L. ; Rech, P. ; VALDERRAMA, C. . Neutron Cross-section of N-Modular Redundancy Technique in SRAM-based FPGAs. In: RADECS 2013, 2013, Oxford. RADECS proceedings, 2013.

• FORO, L. ; Touboul, Antoine ; Wrobel, Frédéric ; RECH, P. ; Dilillo, Luigi ; Frost, C. ; Saigne, Frédéric . Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT. In: RADECS 2013, 2013, Oxford. RADECS proceedings, 2013.

• TONFAT, J. ; AZAMBUJA, J. R. ; G. Nazar ; RECH, P. ; KASTENSMIDT, F. L. ; CARRO, L. ; REIS, R. ; BENFICA, J. ; VARGAS, F. ; BEZERRA, E. . Analyzing the Influence of Voltage Scaling for Single Event Effects in SRAM-based FPGAs. In: RADECS 2013, 2013, Oxford. RADECS proceedings, 2013.

• SABENA, D. ; Sonza Reorda, Matteo ; Sterpone, L. ; Rech, Paolo ; CARRO, L. . On the evaluation of soft-errors detection techniques for GPGPUs. In: International Design & Test Symposium, 2013, Marrakesh. International Design & Test Symposium Proceedings, 2013.

• Rech, P. ; AGUIAR, C. ; Griffoni, A. ; SILVESTRI, M. ; Frost, C. ; CARRO, L. . Neutron-Induced Soft Errors in Graphic Processing Units. In: Nuclear and Space Radiation Effects Conference, 2012, Miami. NSREC DATA WORKSHOP PROCEEDINGS, 2012.

• RECH, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . Neutron-Induced Multiple Output Errors: a Reality on GPUs. In: MEDIAN, 2012, Annecy. ETS, 2012.

• RECH, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . Neutrons Radiation Test of Graphic Processing Units. In: IOLTS, 2012, Seitges. IOLTS 2012 proceedings, 2012.

• Rech, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . Experimental Evaluation of Software Hardening Techniques for GPUs. In: RADECS, 2012, Biarritz. RADECS 2012 proceedings, 2012.

• G. Nazar ; Rech, P. ; Frost, C. ; CARRO, L. . Experimental Evaluation of an Efficient Error Detection Technique for FPGAs. In: RADECS, 2012, Biarritz. RADECS 2012 proceedings, 2012.

• Rech, P. ; AGUIAR, C. ; Frost, C. ; CARRO, L. . Neutron-Induced SER Dependence on Data Types in Graphic Processing Units. In: RADECS, 2012, Biarritz. RADECS 2012 DATAWORKSHOP proceedings, 2012.

• TAMBARA, L. A. ; KASTENSMIDT, F. L. ; LUBASZEWSKI, M. S. ; BALEN, T. R. ; Rech, P. ; Frost, C. . Neutron-induced Single Event Upset in Mixed-Signal Flash-based FPGA. In: RADECS, 2012, Biarritz. RADECS 2012 proceedings, 2012.

• Dilillo, Luigi ; Rech, P. ; Galliere, Jean-Marc ; Girard, Patrick ; Wrobel, Frédéric ; Saigne, Frédéric . Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench. In: 12th Latin American Test Workshop (LATW), 2011, 2011, Porto de Galinhas. 12th Latin American Test Workshop (LATW), 2011, 2011. p. 1-6.

• Dilillo, Luigi ; Bosio, A. ; Rech, P. ; Girard, Patrick ; Wrobel, Frédéric ; Saigne, Frédéric . Robust data collection and transfer framework for a distributed SRAM based neutron sensor. In: 4th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI), 2011, 2011, Bari. 4th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI), 2011, 2011. p. 176-180.

• Griffoni, A. ; Duibenbode, J. ; Linten, D. ; Simoen, E. ; Rech, P. ; Dilillo, Luigi ; Wrobel, Frédéric ; Groeseneken, G. . Neutron-induced failure in super-junction, IGBT, and SiC power devices. In: RADECS 2011, 2011, Sevilla. Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on, 2011.

• Rech, P. ; Galliere, Jean-Marc ; Girard, Patrick ; Griffoni, A. ; Boch, J. ; Wrobel, Frédéric ; Saigne, Frédéric ; Dilillo, Luigi . Neuton-induced Multiple Bit Upsets on dynamically-stressed commercial SRAM arrays. In: RADECS 2011, 2011, Sevilla. Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on, 2011.

• Rech, P. ; Grosso, Michelangelo ; Loparco, Domenico ; Appello, Davide ; Dilillo, Luigi ; Sonza Reorda, Matteo ; Paccagnella, A. . Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. In: IEEE 16th International On-Line Testing Symposium (IOLTS), 2010, 2010, Corfu. IEEE 16th International On-Line Testing Symposium (IOLTS), 2010, 2010. p. 29-34.

• Rech, P. ; Bosio, A. ; Girard, Patrick ; Pravossoudovitch, S. ; VIRAZEL, A. ; Dilillo, Luigi . A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. In: 19th IEEE Asian Test Symposium (ATS), 2010, 2010, Shanghai. 19th IEEE Asian Test Symposium (ATS), 2010, 2010. p. 100-105.

• Appello, Davide ; Bernardi, Paolo ; Gerardin, S. ; Grosso, Michelangelo ; Paccagnella, Alessandro ; Rech, Paolo ; Sonza Reorda, Matteo . DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. In: 27th IEEE VLSI Test Symposium, 2009. VTS '09., 2009, Santa Cruz. 27th IEEE VLSI Test Symposium, 2009. VTS '09., 2009. p. 276-281.

• Rech, Paolo ; Gerardin, S. ; Paccagnella, A. ; Bernardi, Paolo ; Grosso, Michelangelo ; Sonza Reorda, Matteo ; Appello, Davide . Evaluating Alpha-induced soft errors in embedded microprocessors. In: 15th IEEE International On-Line Testing Symposium, 2009. IOLTS 2009., 2009, Sesimbra. 15th IEEE International On-Line Testing Symposium, 2009. IOLTS 2009., 2009. p. 69-74.

• Rech, P. ; Paccagnella, A. ; Grosso, Michelangelo ; Sonza Reorda, Matteo ; Melchiori, Fabio ; Appello, Davide . Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core. In: 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS),, 2009, Bruges. 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS),, 2009. p. 481-488.

• Manuzzato, A. ; Rech, P. ; Gerardin, S. ; Paccagnella, A. ; Sterpone, L. ; Violante, M. . Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs. In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07., 2007, Roma. 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07., 2007. p. 79-86.

• Gerardin, S. ; Bagatin, M. ; Rech, P. ; CESTER, A. ; Paccagnella, Alessandro . Exploiting a Low-Energy Accelerator to Test Commercial Electronics with Low-let Proton Beams. In: RADECS 2006, 2006, Athens. Radiation and Its Effects on Components and Systems (RADECS), 2006 European Conference on, 2006.

• CARVALHO, M. ; SABENA, D. ; Sonza Reorda, Matteo ; Sterpone, L. ; Rech, Paolo ; CARRO, L. . Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications. In: IOLTS, 2014, Barcelona. IOLTS proceedings, 2014.

• Galliere, Jean-Marc ; Rech, Paolo ; Girard, Patrick ; Dilillo, Luigi . A roaming memory test bench for detecting particle induced SEUs. In: IEEE International Test Conference (ITC), 2010, 2010, Austin. IEEE International Test Conference (ITC), 2010, 2010. p. 1-1.

• Rech, P. ; Paccagnella, Alessandro ; Bernardi, Paolo ; Grosso, Michelangelo ; Sonza Reorda, Matteo ; Melchiori, Fabio ; Appello, Davide . Alpha-induced SEU Sensitivity Dependancies on Logic Cells Layout Configurations. In: ITC, 2009, AUSTIN. ITC proceeding, 2009.

• Rech, P. . Guidelines for the Radiation Test of Electronic Devices and Systems. 2013. (Apresentação de Trabalho/Congresso).

• RECH, P. . Radiation Effects on Graphic Processing Units. 2013. (Apresentação de Trabalho/Seminário).

• RECH, P. . Neutron and Heavy Ion Tests. 2012. (Apresentação de Trabalho/Conferência ou palestra).

• Rech, P. ; Galliere, Jean-Marc ; Wrobel, Frédéric ; Saigne, Frédéric ; Girard, Patrick ; Dilillo, Luigi . Dynamic-Stress Test for Efficient Evaluation of Neutron Impact on Commercial SRAMs. 2011. (Apresentação de Trabalho/Congresso).

Projetos de pesquisa

• 2015 - Atual

  Avaliação Experimental e Mitigação dos Efeitos da Radiação em Processadores Paralelos, Descrição: O presente projeto tem como objetivo inicial a caracterização da sensibilidade à radiação dos processadores paralelos modernos e o estudo de novas técnicas eficientes de tolerância a falhas. O estudo proposto é motivado do feito que atualmente os processadores paralelos são utilizados como aceleradores para cálculos de alto desempenho e estão se tornando útil em circuitos de controles em carros, aviões, satélites e missões espaciais. Para o sucesso do projeto o grupo de pesquisa vai aproveitar das colaborações já iniciadas com empresas internacionais como a NVIDIA, a INTEL e a AMD, e de laboratórios de física nuclear como o Los Alamos National Lab e o ISIS.. , Situação: Em andamento; Natureza: Pesquisa. , Alunos envolvidos: Graduação: (2) / Mestrado acadêmico: (1) / Doutorado: (1) . , Integrantes: Paolo Rech - Coordenador / Ronaldo Ferreira - Integrante / Luigi Carro - Integrante / Gabriel Nazar - Integrante / NAVAUX, P. O. A. - Integrante / Daniel Oliveira - Integrante / Thiago Caberlon Santini - Integrante., Financiador(es): Conselho Nacional de Desenvolvimento Científico e Tecnológico - Auxílio financeiro.

• 2008 - 2013

  HAMLET, Descrição: estudar os efeitos da radiação atmosférica em diferentes altitudes. Teste de radiação com balões estratosféricos, aceleradores de partículas, nos laboratórios e nas montanhas na Antártida (Estação CONCORDIA). , Situação: Em andamento; Natureza: Pesquisa. , Integrantes: Paolo Rech - Integrante / Galliere, Jean-Marc - Integrante / Girard, Patrick - Integrante / Wrobel, Frédéric - Coordenador / Saigne, Frédéric - Integrante / Pantel, Denis - Integrante / Chadoutaud, Pierre - Integrante / Cocquerez, Philippe - Integrante / Lacourty, Michel - Integrante / Lam-Trong, Thien - Integrante / Chatry, Christian - Integrante / Laplanche, Florent - Integrante / Pravossoudovitch Serge - Integrante., Financiador(es): ATMEL - Auxílio financeiro / TRAD - Auxílio financeiro., Número de produções C, T & A: 9

• 2007 - 2009

  EURO2000, Descrição: concepção de um novo dispositivo reconfigurável que é resistente à radiação. , Situação: Concluído; Natureza: Pesquisa. , Integrantes: Paolo Rech - Integrante / Bagatin, M. - Integrante / Pontarelli, S. - Integrante / Paccagnella, Alessandro - Coordenador / Melchiori, Fabio - Integrante / Loparco, Domenico - Integrante / Appello, Davide - Integrante., Financiador(es): M2000 - Auxílio financeiro / ST Microelectronics - Crolles - Auxílio financeiro., Número de produções C, T & A: 1

• 2007 - 2009

  PRIN 2007, Descrição: estudo dos efeitos da radiação em FPGAs e lógica programável. , Situação: Concluído; Natureza: Pesquisa. , Integrantes: Paolo Rech - Integrante / Manuzzato, A. - Integrante / Paccagnella, A. - Coordenador / Appello, Davide - Integrante., Financiador(es): ST Microelectronics - Crolles - Auxílio financeiro., Número de produções C, T & A: 3

• 2006 - 2010

  European Project on 8051, Descrição: estudo dos efeitos da radiação em um System on Chip e techniques hardware para aumentar a resistência.. , Situação: Concluído; Natureza: Pesquisa. , Integrantes: Paolo Rech - Integrante / Paccagnella, A. - Integrante / Grosso, Michelangelo - Integrante / Sonza Reorda, Matteo - Integrante / Appello, Davide - Integrante / Paolo Bernardi - Coordenador., Financiador(es): ST Microelectronics - Crolles - Auxílio financeiro., Número de produções C, T & A: 8